Speaker: Christopher Musco
Title: Structured Covariance Estimation
Given access to samples from a distribution D over d-dimensional vectors, how many samples are necessary to learn the distribution’s covariance matrix, T? Moreover, how can we leverage a priori knowledge about T’s structure to reduce this sample complexity?
I will discuss this fundamental statistical problem in the setting where T is known to have Toeplitz structure. Toeplitz covariance matrices arise in countless signal processing applications, from wireless communications, to medical imaging, to time series analysis. In many of these applications, we are interested in learning algorithms that only view a subset of entries in each d-dimensional vector sample from D. We care about minimizing two notions of sample complexity 1) the total number of vector samples taken and 2) the number of entries accessed in each vector sample. The later goal typically equates to minimizing equipment or hardware requirements.
I will present several new non-asymptotic bounds on these sample complexity measures. We will start by taking a fresh look at classical and widely used algorithms, including methods based on selecting entries from each sample according to a “sparse ruler”. Then, I will introduce a novel sampling and estimation strategy that improves on existing methods in many settings. Our new approach for learning Toeplitz structured covariance utilizes tools from random matrix sketching, leverage score sampling for continuous signals, and sparse Fourier transform algorithms. It fits into a broader line of work which seeks to address fundamental problems in signal processing using tools from theoretical computer science and randomized numerical linear algebra.
Christopher Musco is an Assistant Professor in the Computer Science and Engineering department at NYU’s Tandon School of Engineering. His research focuses on the algorithmic foundations of data science and machine learning. Christopher received his Ph.D. in Computer Science from the Massachusetts Institute of Technology and B.S. degrees in Applied Mathematics and Computer Science from Yale University.